Nano - structural materials for thin film solar cells

D.Gracin, K.Juraić1, J.Sancho-Parramon, P. Dubček, S. Bernstorff, M. Čeh, Amorphous-nanocrystalline silicon thin films in next generation of solar cells, 18th International Vacuum Congress, Beijing, China: Chinese Vacuum Society, 2010, Abstracts p 102-102 (oral presenation)

I. Djerdj, D.Gracin, K.Juraić and M.Čeh, Structural properties of SnOx thin films, E-MRS 2011 Spring Meeting, Nice, France, May 9-13 (oral presentation)

K. Juraić , D. Gracin , I.Djerdj, A. Lausi, M. Čeh, D.Balzar, Structural Analysis of amorphous-nanocrystalline silicon thin films by Grazing Incidence X-ray Diffraction, E-MRS 2011 Spring Meeting, Nice, France, May 9-13 (poster)

I.Djerdj, D.Gracina, K.Juraić, D.Meljanac, D.Balzar, Structural analysis of inhomogeneous SnOx thin films, Denver x-Ray Conference, August 1-5, 2011, Colorado Springs, Colorado, USA, (oral presentation)

D.Gracin, K.Juraić, A.Gajović,M.Vaneček, M.Čeh,Nano-strukturirani filmovi silicija za slijedeću generaciju solarnih ćelija, Sedmi znanstveni sastanak Hrvatskog fizikalnog društva, 13-16th October 2011, Zbornik, p 95 (poster)

I.Djerdj,K.Juraić,D.Gracin, Structural features of layered SnO2 thin films (21st Slovenian-Croatian Crystallographic Meeting: Book of abstracts, oral.

K. Juraić, D.Gracin, I.Djerdj, A.Lausi, M.Čeh, D. Balzar, GIXRD analiza tankih filmova amorfno-nanokristalnog silicija, Sedmi znanstveni sastanak Hrvatskog fizikalnog društva,13-16th October 2011, Zbornik p.139 (poster)

I.Djerdj, D.Gracin, K.Juraic, D.Meljanac, M.Čeh, Strukturna analiza monoslojnih i dvoslojnih tankih filmova SnO2, Sedmi znanstveni sastanak Hrvatskog fizikalnog društva,13-16th October 2011, Zbornik p.154 (poster)

D.Gracin, K.Juraić,P.Dubček, A.Marinović, S.Bernstorff, A.Lausi,D.Balzar, M.Čeh, The properties of amorphous-nanocrystalline silicon thin films for next generation of solar cells, Programme and Book of abstracts JVC 14, EVC 12, AMDVG 11, CROSLOVM 18, Dubrovnik 4-8 June, 2012. 45-45 (oral presentation).

I.Djerdj, K.Juraić, A.Marinović, D.Balzar, Microstructural and optical study of inhomogeneous SnO2 thin films(ISMANAM 2012, Book of abstracts, oral presentation)

D.Gracin, A.Šantić,K.Juraić, A.Gajović, M.Čeh, The optical and electrical properties of amorphous- nano-crystalline Si (MPA 2012 6th International Meeing on Developments in Materials, Processes and Applications of Emerging Technologie, Alvor, Portugal, 2-4th July 2012, poster)

D. Gracin, Z.Siketić, K.Juraić, M.Čeh, Analysis of amorphous-nanocrystalline Si thin films by Time-of-Flight Elastic Recoil Detectoin Anlaysis and High Resolution Electron Microscopy (MPA 2012 6th International Meeing on Developments in Materials, Processes and Applications of Emerging Technologie, Alvor, Portugal, 2-4th July 2012, poster)

D.Gracin, K.Juraić,I. Đerđ, A.Lausi, M.Čeh, D.Balzar,Nano Structure of In-homogeneous Amorphous-nano-crystalline Si Thin Films by Grazing Incidence X-ray Diffraction (BITS 1st Annual Conference and Expo of Analytix-2012, Beijing, China : BIT Congress Inc., 2012. 145-145 (invited talk)

D.Gracin, Nano-structured thin silicon for third generation solar cells, Workshop: “Low cost Solar Cells 2011”, Oportunities and Challenges for Green Enegy, Skopje, May, 15-18, 2011 (invited talk)

D.Gracin, K.Juraić, A.Gajović, S.Bernstorff, V.Tudić, M.Čeh Amorphous-nanocrystalline silicon thin films for single and tandem solar cells,Photovoltaic Technical Conference-Thin Film&Advanced Silicon Solutions 2012, Centre de Conges Aixen Provence, Aixen, France, June, 6-8, 2012 (poster).

D.Gracin, K.Juraić, A.Gajović, A.Marinović, P. Dubček, S. Bernstorff, M. Čeh, Amorphous-nano-crystalline silicon thin films in next generation of solar cells (submitted in Vacuum (2012))

I.Djerdj, D.Gracin, K.Juraić, A.Marinović, D.Balzar,Microstructual and optical study of inhomogeneous SnO2 thin films (submitted in Journal of alloys and compounds (2012)).

D.Gracin, Z.Siketić, K.Juraić, M.Čeh, Analysis of amorphous-nanocrystalline silicon thin films by Time-of-Flight Elastic Recoil Detection Analysis and High Resolution Electron Microscopy. (submitted in Applied surface science(2012)).

I.Djerdj,D.Gracin, K.Juraić, D.Meljanac, I.Bogdanović-Radović,G.Pletikapić, Structural analysis of monolayered and bilayered SnO2 thin films (accepted for publ. in Surface and Coatings Technology)

K.Juraić, D.Gracin, I. Djerdj,A. Lausi, M.Čeh, D. Balzar, Structural Analysis of Amorphous-Nanocrystalline Silicon Thin Films by Grazing Incidence X-ray Diffraction NIMB 284 (2012) 78-82